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APA Zitierstil

Rutten, F. J. M., Henderson, J., & Briggs, D. (2009). The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses.

Chicago Zitierstil

Rutten, F. J. M., J. Henderson, and D. Briggs. The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to the Characterization of Opaque Ancient Glasses. 2009.

MLA Zitierstil

Rutten, F. J. M., J. Henderson, and D. Briggs. The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to the Characterization of Opaque Ancient Glasses. 2009.