Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.

APA Citation Edition Citation

Dabas, M., Anest, A., Thiesson, J., & Tabbagh, A. (2016). Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests.

Chicago Citation Edition Citation

Dabas, Michel, A. Anest, J. Thiesson, und A. Tabbagh. Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests. 2016.

MLA Citation Edition Citation

Dabas, Michel, et al. Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests. 2016.