Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.

APA Zitierstil

Dabas, M., Anest, A., Thiesson, J., & Tabbagh, A. (2016). Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests.

Chicago Zitierstil

Dabas, Michel., A. Anest, J. Thiesson, and A. Tabbagh. Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests. 2016.

MLA Zitierstil

Dabas, Michel., A. Anest, J. Thiesson, and A. Tabbagh. Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: Check of the DualEM-421S Instrument and Field Tests. 2016.