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|a 238055
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| 091 |
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|a rgkcov2011
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| 100 |
1 |
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|a Kimball, Larry R.
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| 245 |
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4 |
|a The analysis of microwear polishes with the atomic force microscope.
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| 260 |
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|a Forlì,
|c 1998.
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| 300 |
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|a 1121-1132 :
|b Abb.
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| 590 |
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|a brgk
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| 700 |
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|a Kimball, John F.
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|a Allen, Patricia E.
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| 773 |
0 |
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|w 000189788
|t Atti (6) del 13 Congresso, Forlì, 8-14 settembre 1996.
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| 942 |
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|c AN
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| 650 |
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|a Gebrauchspurenanalyse (Allg.)
|2 yRGKNaturMaterGebra
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| 650 |
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|a Rasterelektronenmikroskopie (REM)/Mikroskopie
|2 yRGKNaturMaterSpeziRaste
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| 040 |
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|a DE-2553
|c DE-2553
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| 999 |
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|c 753226
|d 753226
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| 953 |
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|b DAIE
|z Automatically added holding branch key.
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|b DAIF
|z Automatically added holding branch key.
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|b DAIR
|z Automatically added holding branch key.
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