The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses.
1. Verfasser: |
Rutten, F. J. M.
|
---|---|
Weitere Verfasser: |
Henderson, J.
Briggs, D. |
Ort/Verlag/Jahr: |
2009.
|
Umfang/Format: |
966-986 : Abb. |
Schlagworte: | |
iDAI.gazetteer: |
Mesopotamien Italia |
Enthalten in: | Archaeometry, 51,6 (2009) |
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100 | 1 | |a Rutten, F. J. M. | |
245 | 1 | 4 | |a The application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to the characterization of opaque ancient glasses. |
260 | |c 2009. | ||
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700 | 1 | |a Henderson, J. | |
700 | 1 | |a Briggs, D. | |
773 | 0 | |w 001155575 |t Archaeometry, 51,6 (2009) | |
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